Measurement capabilities
Applications in Scanning Probe Microscopy
Our self-sensing cantilevers are designed for measurements in SPM applications with high precision — from topography (AFM) and mechanical properties to KPFM/EFM, conductive AFM, cryogenic and quantum force sensing, MFM, and in-liquid biosensing.
Topography and structure
Surface height, 3D profile, phase imaging.
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Mechanical properties
Stiffness, adhesion, friction, viscoelasticity.
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KPFM and EFM
Surface potential, work function, doping.
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Conductive measurements
cAFM, nanoprobing, IV spectroscopy, SSRM.
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Low-temperature and quantum
Quantum Twisting Microscopy, QCT cantilevers.
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MFM
Magnetic force microscopy.
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In-liquid and biosensing
Opaque and transparent liquid environments.
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Not sure which mode fits your measurement?
The capabilities above are the most common starting points. We work on plenty of measurements that don't fit a neat label — describe yours and we'll respond honestly.