Being founded in 2020 c-sense moved its head quarters to a new location in TFZ Technologie und Forschungszentrum. The new laboratory has a fantastic view and includes a fully equipped electronics workshop and setups for roughness measurements, 3D surface models and line scans.

NanoInspect Pushing the frontiers of analysis! Versatile wafer quality inspection system Correlated Analysis System for in-vivo Inspection of Semi-Conductor Process Wafers. We will develop a new tool for in-vivo high-speed correlated analysis of up-to 300mm semiconductor wafers. It will combine a wide range of surface analysis methods, being important in the quality assurance and process control in the chip production. Surface analysis and material characterization of thin layers or devices at...