1–6 December 2024 | Boston, USA

c-sense is excited to participate in the Materials Research Society (MRS) Fall Meeting, one of the largest and most prestigious events in materials science. Join us from December 1–6, 2024, to explore our latest innovations and groundbreaking technologies for nanoscale analysis.

LaReCa Project: Developing high-resolution nanosensor systems for the semiconductor industry We are happy to celebrate the first year of progress in the LaReCa project! Through this innovative initiative, we are advancing high-resolution nanosensor systems designed specifically for the semiconductor industry. Leveraging self-sensing cantilevers and cutting-edge Focused Electron Beam Induced Deposition (FEBID) technology, LaReCa is set to make a significant impact in nanoscale sensing. Project...

Materials Science and Engineering Congress (MSE 2024) | 24-26 September 2024 | Darmstadt, Germany c-sense was proud to participate in the prestigious Materials Science and Engineering Congress (MSE 2024) in Darmstadt, Germany. Our team had the opportunity to present groundbreaking developments on our Nanomechanical Microscope highlighting the first stunning results of correlative analysis with nanoindentation and AFM measurements, designed to push the boundaries of nanoscale material analysis....

NanoInspect Nanomechanical microscope: Correlated Analysis with AFM and Nanoindentation We are thrilled to share that the ‘NanoInspect’ project is nearing its completion! Our team has achieved the first successful correlated measurements using nanoindentation and AFM topography, marking a significant milestone. This breakthrough product will be available on the market soon, offering cutting-edge capabilities for the research community and industry alike. Key Advantages of the NanoInspect...

Trilayer cantileversRedefining sensitivity and adaptability in AFM applications c-sense introduces its innovative Trilayer cantilever Technology, offering unparalleled sensitivity and versatility for advanced Atomic Force Microscopy (AFM) applications. This breakthrough design achieves up to 4x higher sensitivity than traditional silicon-based cantilevers and is compatible with both opaque and conductive liquids, enabling reliable performance across various AFM applications. Our trilayer...

In-situ microscopy as a tool for the development of new materials, more efficient energy storage systems, and semiconductor devices.

Project No.: FW10010168

The main goal is to develop and commercialize a new generation of AFM accessories for electron microscopes, thereby significantly increasing their use for comprehensive in-situ characterization of new materials, energy storage technologies, and in the semiconductor industry.

Being founded in 2020 c-sense moved its head quarters to a new location in TFZ Technologie und Forschungszentrum. The new laboratory has a fantastic view and includes a fully equipped electronics workshop and setups for roughness measurements, 3D surface models and line scans.

NanoInspect Pushing the frontiers of analysis! Versatile wafer quality inspection system Correlated Analysis System for in-vivo Inspection of Semi-Conductor Process Wafers. We will develop a new tool for in-vivo high-speed correlated analysis of up-to 300mm semiconductor wafers. It will combine a wide range of surface analysis methods, being important in the quality assurance and process control in the chip production. Surface analysis and material characterization of thin layers or devices at...