TOUCH AND FEEL AT THE NANOSCALE
NanoInspect – Pushing the frontiers of analysis!
NanoInspect Pushing the frontiers of analysis! Versatile wafer quality inspection system Correlated Analysis System for in-vivo Inspection of Semi-Conductor Process Wafers. We will develop a new tool for in-vivo high-speed correlated analysis of up-to 300mm semiconductor wafers. It will combine a wide range of surface analysis methods, being important in the quality assurance and process control in the chip production. Surface analysis and material characterization of thin layers or devices at...
c-sense moved to its new office and laboratory
Being founded in 2020 c-sense moved its head quarters to a new location in Tech Park Vienna. The new laboratory has a fantastic view and includes a fully equipped electronics workshop and setups for roughness measurements, 3D surface models and line scans.
NASSWAF (Nano Surface Scanner for Wafers) project gets the EUREKA label!
Eureka is the world’s biggest public network for international cooperation in R&D and innovation, present in over 45 countries. Globalstars is the programme with calls for projects with countries outside the Eureka network – beyond EUROPEAN borders.We are proud that c-sense succeeded to get the EUREKA-label within the 2nd EUREKA GlobalStars-Singapore Call for proposals for Joint R&D Projects under EUREKA between Singapore and the EUREKA member countries. Out of 85 applications, our...