Meet c-sense at MRS Fall Meeting | 1-6 Dec 2024, Boston USA

c-sense is excited to participate in the Materials Research Society (MRS) Fall Meeting, one of the largest and most prestigious events in materials science. Join us from December 1–6, 2024, to explore our latest innovations and groundbreaking technologies for...

Celebrating the first year of success in the LaReCa project

LaReCa Project: Developing high-resolution nanosensor systems for the semiconductor industry We are happy to celebrate the first year of progress in the LaReCa project! Through this innovative initiative, we are advancing high-resolution nanosensor systems designed...

Our NanoInspect Project nears its completion

NanoInspect Nanomechanical microscope: Correlated Analysis with AFM and Nanoindentation We are thrilled to share that the ‘NanoInspect’ project is nearing its completion! Our team has achieved the first successful correlated measurements using nanoindentation and AFM...

New product line: The Trilayer Cantilever technology

Trilayer cantileversRedefining sensitivity and adaptability in AFM applications c-sense introduces its innovative Trilayer cantilever Technology, offering unparalleled sensitivity and versatility for advanced Atomic Force Microscopy (AFM) applications. This...

BEAST Project in co-operation with Nenovision

In-situ microscopy as a tool for the development of new materials, more efficient energy storage systems, and semiconductor devices.   Project No.: FW10010168 This project is co-financed with state support from the Technology Agency of the Czech Republic within...