Correlated Analysis with a Nanomechanical Microscope
At EUROMAT 2025 – the 18th European Congress and Exhibition on Advanced Materials and Processes, c-sense presented its latest concept for interactive correlated nanomechanical analysis, demonstrating how Atomic Force Microscopy (AFM) and nanoindentation can be seamlessly combined into a single instrument.
Eliminating the Gap Between Imaging and Mechanical Testing
Conventional workflows require researchers to move samples between an AFM and a nanoindenter. While each instrument delivers excellent performance individually, transferring the sample makes precise repositioning difficult, interrupts the experiment, and significantly increases measurement time.
The c-sense Nanomechanical Microscope addresses this challenge by integrating both techniques into one platform. Researchers can identify a point of interest with AFM, perform nanoindentation with nanometer positioning accuracy, and immediately continue imaging—all without moving the sample.
Powered by Self-Sensing Cantilever Technology
A key enabling technology is c-sense's all-electric self-sensing cantilever, which measures displacement, phase, and resonance frequency using an integrated sensor. Since no laser beam deflection system is required, the instrument offers exceptional flexibility for demanding applications, including operation in liquids, multifunctional probe designs, and high-speed dynamic measurements.
Real-Time Correlated Analysis
The presentation demonstrated how researchers can:
- locate interesting micro- or nanostructures with AFM,
- perform precisely positioned nanoindentation,
- immediately analyse force-distance curves together with the resulting surface topography,
- repeat measurements interactively to investigate local material properties such as grain boundaries, strain hardening, or mechanical heterogeneity.
By eliminating sample transfers, correlated analysis becomes a continuous and highly interactive process rather than a sequence of disconnected measurements.
Broad Application Potential
The platform is designed for a wide range of research fields, including:
- nanomaterials characterization,
- nanoindentation and hardness mapping,
- thin-film and multilayer solar cells,
- localized high-pressure experiments,
- piezotronic materials,
- bio- and cell research,
- experiments under controlled atmospheres such as argon or nitrogen gloveboxes.
Because the compact instrument can also operate inside environmental chambers or gloveboxes, it opens new possibilities for studying air-sensitive materials under realistic operating conditions.
Looking Ahead
The positive discussions at EUROMAT confirmed the growing demand for integrated characterization tools that combine multiple nanoscale measurement techniques into a single workflow.
At c-sense, we believe that correlated analysis is becoming an essential approach for next-generation materials research. By bringing AFM, nanoindentation, and future complementary techniques onto one platform, we aim to simplify experimental workflows while enabling entirely new classes of nanoscale investigations.
We thank everyone who visited our presentation and look forward to continuing the discussions with researchers and partners interested in advanced correlated nanomechanical characterization.
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