Correlated Analysis with a Nanomechanical Microscope

Link to presentation: https://docs.google.com/presentation/d/13zqmofAHa0rvR46J5FocXX9l2IsZkd_e/edit?usp=sharing&ouid=114000352810079292742&rtpof=true&sd=true

At EUROMAT 2025 – the 18th European Congress and Exhibition on Advanced Materials and Processes, c-sense presented its latest concept for interactive correlated nanomechanical analysis, demonstrating how Atomic Force Microscopy (AFM) and nanoindentation can be seamlessly combined into a single instrument. 

Eliminating the Gap Between Imaging and Mechanical Testing

Conventional workflows require researchers to move samples between an AFM and a nanoindenter. While each instrument delivers excellent performance individually, transferring the sample makes precise repositioning difficult, interrupts the experiment, and significantly increases measurement time. 

The c-sense Nanomechanical Microscope addresses this challenge by integrating both techniques into one platform. Researchers can identify a point of interest with AFM, perform nanoindentation with nanometer positioning accuracy, and immediately continue imaging—all without moving the sample. 

Powered by Self-Sensing Cantilever Technology

A key enabling technology is c-sense’s all-electric self-sensing cantilever, which measures displacement, phase, and resonance frequency using an integrated sensor. Since no laser beam deflection system is required, the instrument offers exceptional flexibility for demanding applications, including operation in liquids, multifunctional probe designs, and high-speed dynamic measurements. 

Real-Time Correlated Analysis

The presentation demonstrated how researchers can:

• locate interesting micro- or nanostructures with AFM, 
• perform precisely positioned nanoindentation, 
• immediately analyse force-distance curves together with the resulting surface topography, 
• repeat measurements interactively to investigate local material properties such as grain boundaries, strain hardening, or mechanical heterogeneity. 

By eliminating sample transfers, correlated analysis becomes a continuous and highly interactive process rather than a sequence of disconnected measurements.

Broad Application Potential

The platform is designed for a wide range of research fields, including:

• nanomaterials characterization, 
• nanoindentation and hardness mapping, 
• thin-film and multilayer solar cells, 
• localized high-pressure experiments, 
• piezotronic materials, 
• bio- and cell research, 
• experiments under controlled atmospheres such as argon or nitrogen gloveboxes. 

Because the compact instrument can also operate inside environmental chambers or gloveboxes, it opens new possibilities for studying air-sensitive materials under realistic operating conditions. 

Looking Ahead

The positive discussions at EUROMAT confirmed the growing demand for integrated characterization tools that combine multiple nanoscale measurement techniques into a single workflow.

At c-sense, we believe that correlated analysis is becoming an essential approach for next-generation materials research. By bringing AFM, nanoindentation, and future complementary techniques onto one platform, we aim to simplify experimental workflows while enabling entirely new classes of nanoscale investigations.

We thank everyone who visited our presentation and look forward to continuing the discussions with researchers and partners interested in advanced correlated nanomechanical characterization.

2D Materials Conference
06/08/2026

At the 2D Materials Conference 2026 in Munich, c-sense, together with partners from attocube systems, ETH Zurich, EPFL, and the Weizmann Institute of Science, presented a new experimental platform for Rotational AFM/CFM for Quantum Optical Twisting Microscopy (QOTM). The collaborative work demonstrates how advanced self-sensing AFM technology can enable entirely new experiments on quantum materials under cryogenic conditions. 

Exploring Twistronics at the Nanoscale

The remarkable electronic properties of many two-dimensional materials strongly depend on the relative rotational angle between individual layers—a rapidly growing research field known as twistronics. Studying these materials requires precise positioning, stable operation at cryogenic temperatures, and the ability to combine multiple characterization techniques within a single experimental platform.

The presented system integrates Atomic Force Microscopy (AFM) and Confocal Fluorescence Microscopy (CFM) while enabling controlled rotation of either the sample or the probe. The platform allows researchers to investigate twist-angle dependent phenomena with exceptional positional stability inside an attoDRY2200 cryostat. 

Self-Sensing Cantilevers Enable the Platform

A key enabling component of the system is the c-sense self-sensing piezoresistive Trilayer cantilever. Unlike conventional optical AFM detection, the integrated sensor eliminates the need for laser beam deflection, making it ideally suited for highly compact cryogenic instrumentation.

The poster also introduced novel inverted cantilever concepts and demonstrated the performance of the self-sensing AFM module, including low-noise operation and reliable functionality under demanding experimental conditions. 

Towards Quantum Optical Twisting Microscopy

The presented setup enables a variety of new experimental capabilities, including:

• precise repositioning of the rotation axis at cryogenic temperatures, 
• rotation of either the sample or the AFM probe, 
• simultaneous AFM and confocal microscopy, 
• electrical characterization through conductance measurements, 
• approach-retract force measurements, 
• imaging using tunneling current. 

Together, these capabilities establish a versatile platform for investigating twist-angle dependent quantum phenomena with nanometer precision. 

Strong Collaboration Driving Innovation

The project represents a successful collaboration between researchers from attocube systems, ETH Zurich, EPFL, Weizmann Institute of Science, and c-sense, combining expertise in cryogenic instrumentation, quantum optics, AFM technology, and self-sensing cantilever development. 

Looking Ahead

As quantum materials continue to push the boundaries of condensed matter physics, new instrumentation concepts become essential for unlocking their full potential.

At c-sense, we are proud that our self-sensing cantilever technology forms a key building block of this innovative measurement platform. We thank all conference participants for the inspiring discussions and look forward to further collaborations that advance the next generation of nanoscale characterization tools.

Link to poster: https://drive.google.com/file/d/1MPozdXc5WyeJC87e2SYX5Vg_sIUAsTWP/view?usp=drive_link