c-sense at nano tech 2025 | 29-31 Jan 2025, Tokyo Japan

Join c-sense at the International Nanotechnology Exhibition and Conference (nano tech 2025) in Tokyo, from January 29–31, 2025. Visit us at Booth 4K-03 to explore our latest innovations, including the first stunning results of a correlative analysis using our...

Meet c-sense at MRS Fall Meeting | 1-6 Dec 2024, Boston USA

c-sense is excited to participate in the Materials Research Society (MRS) Fall Meeting, one of the largest and most prestigious events in materials science. Join us from December 1–6, 2024, to explore our latest innovations and groundbreaking technologies for...

Celebrating the first year of success in the LaReCa project

LaReCa Project: Developing high-resolution nanosensor systems for the semiconductor industry We are happy to celebrate the first year of progress in the LaReCa project! Through this innovative initiative, we are advancing high-resolution nanosensor systems designed...

Our NanoInspect Project nears its completion

NanoInspect Nanomechanical microscope: Correlated Analysis with AFM and Nanoindentation We are thrilled to share that the ‘NanoInspect’ project is nearing its completion! Our team has achieved the first successful correlated measurements using nanoindentation and AFM...

New product line: The Trilayer Cantilever technology

Trilayer cantileversRedefining sensitivity and adaptability in AFM applications c-sense introduces its innovative Trilayer cantilever Technology, offering unparalleled sensitivity and versatility for advanced Atomic Force Microscopy (AFM) applications. This...