Product launches, project milestones, and where to find us at upcoming conferences.
c-sense COO Thomas Fiedler presented self-sensing cantilevers, TriLayer and SNM² at the 27th nanoNET-Austria Meeting during the Millennium Innovation Days 2026 in Lustenau.
read more...At NANOscientific Forum Europe 2026 in Prague, c-sense presented a rotational AFM/CFM platform for Quantum Optical Twisting Microscopy, developed with attocube systems, ETH Zurich, EPFL and the Weizmann Institute of Science.
read more...c-sense presented a rotational AFM/CFM platform for Quantum Optical Twisting Microscopy, developed with attocube systems, ETH Zurich, EPFL, and the Weizmann Institute of Science.
read more...A custom trilayer cantilever for quantum experiments at cryogenic temperatures, building on EPFL research published in Nature Electronics.
read more...c-sense presented a concept at EUROMAT 2025 integrating Atomic Force Microscopy and nanoindentation into a single instrument — the c-sense Nanomechanical Microscope.
read more...c-sense exhibited at nano tech 2025 in Tokyo, showing first correlative-analysis results from the Nanomechanical Microscope developed with Alemnis AG.
read more...c-sense presented correlative-analysis results from the Nanomechanical Microscope at the MRS Fall Meeting in Boston, booth #317.
read more...Progress update on LaReCa — high-resolution nanosensor systems for the semiconductor industry, using self-sensing cantilevers and FEBID technology.
read more...c-sense showcased the first correlative AFM and nanoindentation results at the Materials Science and Engineering Congress 2024 in Darmstadt.
read more...The NanoInspect nanomechanical microscope project, combining nanoindentation and AFM topography, approaches completion with correlated measurements demonstrated.
read more...c-sense unveiled its Trilayer cantilever technology, delivering up to 4x higher sensitivity than conventional silicon cantilevers.
read more...A collaborative research initiative with Nenovision to develop and commercialize a new generation of AFM accessories for electron microscopes.
read more...c-sense relocated its headquarters to a new laboratory at TFZ Technologie und Forschungszentrum.
read more...Introducing NanoInspect, a versatile wafer quality inspection system for correlated analysis of semiconductor process wafers up to 300mm.
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