Trilayer cantilevers · Tip-integrated

Trilayer Cantilever Probes

Silicon Nitride-Polymer probes for Scanning Probe Microscopy

General description

The Trilayer Cantilevers (TLC) feature a unique structure with Silicon Nitride films and a polymer core, resulting in increased thickness without excessive stiffness. This design significantly amplifies force sensitivity (μV/nN), surpassing standard single-crystalline Si cantilevers by a factor of 4x. Due to the low Q-factor of less than 250 (even in a vacuum), the TLC enables scanning speeds up to 10x faster than those achievable with Si or SiN-CL.

Additionally, the electrical insulation of electronic sensors within the SiN/Polymer interface ensures robustness and reliability even in harsh conditions. This feature enables the TLC to function seamlessly in electrically conductive media.

Applications

  • AFM: Integration on standard AFM scanners, high speed AFM
  • Force or deflection measurements
  • Measurements within TEM, SEM, XPS, etc.
  • Measurements in liquids – even opaque or conductive liquids.

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Trilayer Cantilevers (TLC): Specifications

Parameter Value
ModelTrilayer Cantilevers (TLC)
MaterialSiN shell with polymer core
Tip materialSilicon or Tipless
ModesStatic and dynamic modes
Deflection sensingOn-chip piezoresistive bridge
ActuatorExternal shaker (or upon request: on-chip)
Electrical connectionsBonded to small PCB with connector (counterpart PCB available) or delivered as bare chip (bonding pads on-chip)

Nominal Dimensions & Performance

Nominal Dimensions (µm × µm × µm) Nominal Res. Freq. (kHz) Nominal Spring Const. (N/m) Deflection Sensitivity* (µV/nm)
220 × 40 × 4802.53
180 × 40 × 41204.55
90 × 40 × 45004019

* Not amplified (signal direct at the chip), 2.048 V bridge supply.

References: Hosseini, N., et al. Nature Electronics, 2024 · DOI: 10.1038/s41928-024-01195-z

Schematic of the Trilayer cantilevers
Schematic of the Trilayer cantilevers
Tipless TLC with integrated heater
Image of a tipless TLC with integrated heater (optional) for thermal excitation.
SEM image of a TLC with Si tip
SEM image (colored) of a TLC with Si Tip
SEM image of the Si tip
SEM image of the Si tip (radius <20nm)

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